Uncertainty of the X-ray Diffraction (XRD) sin2 ψ Technique in Measuring Residual Stresses of Physical Vapor Deposition (PVD) Hard Coatings

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Technique in Measuring Residual Stresses of Physical Vapor Deposition (PVD) Hard Coatings

Residual stresses of physical vapor deposition (PVD) hard coatings can be measured using X-ray diffraction (XRD) methods under either conventional d-sin2 ψ mode or glancing incident (GIXRD) mode, in which substantial uncertainties exist depending on the applied diffraction parameters. This paper reports systematic research on the effect of the two analytical modes, as well as the anisotropic el...

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ژورنال

عنوان ژورنال: Coatings

سال: 2017

ISSN: 2079-6412

DOI: 10.3390/coatings7080128